Receptacle KS-001 47 G Item KS-00147G

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Conformation of RoHS compliance (EN|PDF)
Product datasheet (EN|pdf)
CAD file (INGUN_KS-001_47_G.STEP)
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KS-001 47 G (KS-00147G) INGUN SELECTION
KS-001 30 G (KS-00130G) INGUN SELECTION KS-001 47 G (KS-00147G) INGUN SELECTION
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Technical data
General data
Product group : Receptacles (KS)
Series : KS-001
Sub-series : KS-001 press-in version
Type of receptacle connection : Wire-wrap
Press ring : Yes
Surface area : Gold
Collar diameter : 1.45 mm
Collar height : 4 mm
Knurl : No
Vacuum-tight : No
RoHS-compliant : RoHS-3
Mounting hole
Mounting hole in CEM1 : 1.31 - 1.32 mm
Mounting hole in FR4 : 1.31 - 1.32 mm
Mounting hole with press ring in CEM1 : 1.36 - 1.40 mm
Mounting hole with press ring in FR4 : 1.36 - 1.40 mm
Mechanical data
Total length : 27.5 mm
Outer diameter : 1.32 mm
Spring-loaded test probe GKS-001 302 150 A 0600 Item GKS-001-0023
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-001 303 150 A 0600
Spring-loaded test probe GKS-001 303 150 A 0600 Item GKS-001-0020
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 305 100 A 1500 Item GKS-001-0021
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-001 303 150 A 1500
Spring-loaded test probe GKS-001 303 150 A 1500 Item GKS-001-0017
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 204 150 A 1500 Item GKS-001-0022
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-001 305 100 A 1000
Spring-loaded test probe GKS-001 305 100 A 1000 Item GKS-001-0005
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 302 150 A 1500 Item GKS-001-0030
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-001 306 150 A 1000
Spring-loaded test probe GKS-001 306 150 A 1000 Item GKS-001-0001
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 306 150 A 0600 Item GKS-001-0010
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-001 201 075 A 1000
Spring-loaded test probe GKS-001 201 075 A 1000 Item GKS-001-0007
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-001 306 100 A 1000
Spring-loaded test probe GKS-001 306 100 A 1000 Item GKS-001-0003
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 201 075 A 0600 Item GKS-001-0024
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 305 100 A 0600 Item GKS-001-0015
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 307 150 A 1500 Item GKS-001-0018
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 306 100 A 0600 Item GKS-001-0012
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-001 306 100 A 1500
Spring-loaded test probe GKS-001 306 100 A 1500 Item GKS-001-0014
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 204 150 A 0600 Item GKS-001-0032
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 302 150 A 1000 Item GKS-001-0004
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 307 150 A 0600 Item GKS-001-0026
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-001 303 150 A 1000
Spring-loaded test probe GKS-001 303 150 A 1000 Item GKS-001-0011
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 204 150 A 1000 Item GKS-001-0013
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-001 201 075 A 1500
Spring-loaded test probe GKS-001 201 075 A 1500 Item GKS-001-0008
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
INGUN SELECTION GKS-001 306 150 A 1500
Spring-loaded test probe GKS-001 306 150 A 1500 Item GKS-001-0002
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.
Spring-loaded test probe GKS-001 307 150 A 1000 Item GKS-001-0016
  • Robust, compact design for harsh ICT/FCT applications with limited space
  • For optimum contact at the test points (e.g. pads, vias, and pins), various tip styles in different diameters and finishes, as well as various spring forces are available. spring forces.