Product information "S-075 307 150 A 2000 S"
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
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Product Details
- Use of larger test probes for increased contacting accuracy and longer service life
- Minimal grid dimensions due to omission of receptacles (socketless)
- Large selection of tip styles and spring forces for optimal contact with the test point
- Compatible with existing socketless systems
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Technical data
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