INGUNGLOSSARY

From A to Z – technical terms explained concisely

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A spring-loaded test probe typically consists of three components; the plunge...

The basic unit is a sub-assembly of a test fixture, which is modularly constr...

Depending on the number of electronic assemblies to be tested, there are corr...

Bead probes are used to contact small solder beads directly on PCB tracks or ...

Beading is a deformation of the material around the circumference of test pro...

Board marker probes (ME), or marking units, are intended for the reliable mar...

In boundary scan testing, analogue and digital components for which no direct...

Button activators (TAB) can perform space-saving activation of buttons and sw...