Our classic GKS-100 series of test probes with a 100-mil pitch are used for classic solar cells with busbars and are installed in specialised contact strips. Flat head geometries are recommended, either passive or with an inverse cone or wafer structure. In combination with low spring forces of up to 1 N, they ensure gentle contacting while providing precise current and voltage measurement.
Alternatively, you can use threaded test probes from the GKS-112 M series in the same grid, which are ideal for overhead installation.
New solar cell technologies are increasingly dispensing with busbars in order to increase efficiency. Instead, they rely on fine contact fingers, rear contact terminals, or innovative connection technologies.
With its patented STS series, INGUN offers solar test strips that make consistent, gentle contact with even the finest structures. Current and voltage are measured separately and galvanically isolated via 100% gold-plated contact elements.
- Automatic tolerance compensation
- Compatible with standard and half cells
- Supports electroluminescence imaging with uniform current density
- Service life of up to 10 million contact cycles
In our TechTalk, you will learn how thin-film perovskite cells differ from classic silicon cells, what advantages they offer, and what challenges still need to be overcome before a breakthrough can be achieved.
