Aggressive, self-cleaning tip styles are suitable for flat test points with contaminated or coated surfaces. Passive tip styles are used for clean pads to avoid puncture points.
Tip: Be aware of the penetration depth for multi-layer printed circuit boards – especially with aggressive tip styles in combination with high spring forces.
Vias can be contacted using 3-edged tip styles on the inner surface of the ring, or with the points of a crown tip style on the surface of the via.
Aggressive, self-cleaning tip styles are suitable for flat test points with contaminated or coated surfaces. Passive tip styles are used for clean pads to avoid puncture points.
Tip: Be aware of the penetration depth for multi-layer printed circuit boards – especially with aggressive tip styles in combination with high spring forces.
Vias can be contacted using 3-edged tip styles on the inner surface of the ring, or with the points of a crown tip style on the surface of the via.
How to find the right test probe
In our webinar, you will learn how to select the ideal test probe step by step, and what you need to bear in mind during installation.
The barrel accommodates the plunger and the spring; it transmits the electrical signal. An organic protective layer improves the plunger’s movement inside the barrel.
The spring ensures the consistent contact force, even after several thousand mechanical contacts (load cycles).
The plunger ensures low contact resistance and is usually made from steel or beryllium copper (CuBe), and occasionally brass.
The plunger tip always depends on the application. There are numerous versions, including passive, aggressive, self-cleaning tips.
The barrel accommodates the plunger and the spring; it transmits the electrical signal. An organic protective layer improves the plunger’s movement inside the barrel.
The spring ensures the consistent contact force, even after several thousand mechanical contacts (load cycles).
The plunger ensures low contact resistance and is usually made from steel or beryllium copper (CuBe), and occasionally brass.
The plunger tip always depends on the application. There are numerous versions, including passive, aggressive, self-cleaning tips.
International standard test probes have no collar and are the proven solution for classic ICT/FCT applications in 39 to 100 mil pitches.
Versions with a 9.3 mm long stroke are available for combined ICT/FCT tests.
The compact, robust versions of our standard probes are suitable for harsh operating conditions and test fixtures with limited installation space.
Unlike press-in test probes, screw-in versions are firmly screwed into the receptacle. This makes them ideal for applications subject to vibrations, overhead mounting, or high mechanical stress.
E-TYPE® test probes offer increased spring preload, ensuring reliable contact despite FLUX residues, oxidation, or insulating layers on PCBs.
Our E-TYPE Fusion series is suitable for even more demanding applications with OSP coating. It combines increased spring preload with particularly aggressive tip styles and a resistant coating.
Rotating test probes are the right choice for persistent contact problems. Their rotating motion allows them to penetrate hard, insulating surface layers with ease.
High-current test probes have a two-part plunger and can transmit currents of up to 100 A. During the stroke movement, the two plunger components are deflected away from each other in a radial direction. In doing so, they press against the inner surface of the probe’s barrel, reducing the contact resistance.
Coaxial dipole and radio-frequency probes are available for four-wire measurements and the transmission of radio-frequency signals. They enable high-precision voltage, current, and radio-frequency measurements up to 12 GHz, ideal for coaxial and differential test points as well as miniature switches.
Fine-pitch test probes are the first choice for test points that are close together.
For maximum mechanical stability with a larger probe diameter, we recommend our socketless S-Line series, which features contact terminals instead of receptacles.
If maximum flexibility for testing is also required, SleeveProbe™ is the ideal solution: its innovative design enables 360° contacting and free positioning of the test probes, combining compact dimensions with the durability of a 100-mil standard probe.
Pneumatic test probes are used for individual test points, e.g. for actuating buttons or for contacting hard-to-reach areas – regardless of the fixture stroke.
The plunger extends when compressed air is applied and retracts thanks to a return spring. Contacting is precisely controlled without mechanical effort, which is ideal for sequential test sequences or specialised applications.
If a presence check is also to be carried out, pneumatic test probes with integrated switches are available.
Flying probes are designed for maximum accuracy. Their specialised barrels and beading features enable precise contacting even at a pitch of 0.15 mm.
They are used in high-mix, low-volume production with flying probers, where changing assemblies are tested.
Metric standard probes are suitable for applications that require increased mechanical durability and flexible adjustment of the installation height. They have larger plunger diameters and a pronounced collar (stop). Thanks to various collar heights, the installation height can be freely adjusted, even after installation, without the use of spacer sleeves.
Some probe versions are additionally equipped with a central beading feature, which reduces wobble and is therefore particularly suitable for contacting small test points.
Like international standard probes, metric versions are also available in various lengths and for a range of grid sizes (pitch distances).
