e-type® test probes have a higher preload in comparison to standard test probes.
This initial higher spring force guarantees a secure contact at the same final load (the spring force is equal to that of the comparable standard test probe at working stroke).
E-type® test high-energy Probes enable the highest contact security on the PCB/UUT without additional stress.
When contacting on the test surface, up to a 100% higher spring force
is available, which is achieved by the increased spring pre-load of the
During the working stroke, however, the
e-type® probes have the same spring force as standard test probes. The
additional contact energy gained ensures a contact area between the
test probe and the PCB which is up to 25% larger.
INGUN e-type® probes are supplied in all current grid sizes (50, 75, 100 Mil), and are compatible with the standard GKS-050/075/100/422 series.