Standard stroke test probes
Consistently proven to be reliable ICT/FCT test probes.
Depending on the working stroke of the test fixture or the component/test points to be tested, various installation heights are necessary. These can be achieved by a choice of combinations of test probes and receptacles. Thus, the optimal working stroke with nominal spring force can be achieved.
Test probes come in standard, L (+ 2.0 mm), and E (+ 5.0 mm) versions, as well as receptacles with various collar heights.
Long stroke test probes
Used for combined ICT/FCT test in dual-stage test fixtures.
Used to transmit signals over a spring-loaded plunger on a transfer PCB. Thus, a cable is not required.
Short / robust test probes
Stand out due to their robust, compact design. This makes them suitable for harsh ICT/FCT applications with limited space available, as well as in larger grid sizes.