International standard spring-loaded test probes (GKS) (inch)
Available in two different versions: Standard working stroke (4.3 mm) and longer working stroke (9.3 mm) for dual-stage test fixtures to combine ICT and FCT. Wireless receptacles enable the wireless connection of test probes using a transfer PCB.
Test probes have a higher preload in comparison to standard test probes.
This initial higher spring force guarantees a secure contact at the same final load (the spring force is equal to that of the comparable standard test probe at working stroke).
Rotating test probes
Can provide a reliable alternative if contacting problems occur. A rotating movement during the stroke process scratches the surface to be contacted, thus insulating layers are securely penetrated.
Bead test probes
Are used to contact beads on PCBs. A variety of tip styles are available depending on the beads.
Fine-pitch test probes
Are used to contact very small test point in small grids. These are sometimes mounted without receptacles.
Metric test probes (metric standard)
In addition to the classic ICT/FCT test probes without collars, the metric standard test probes stand out due to their stability and robustness and all feature a pronounced collar.